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Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working

$ 3170.17

Availability: 30 in stock
  • Category: Semiconductor Tools Systems and Components
  • SYSTEM/TOOL: Nikon NRM-3100 300mm Wafer Overlay Measurement System
  • Condition: Removed from a Nikon NRM-3100 300mm Wafer Overlay Measurement System
  • MPN: Inspection Stage Chuck
  • Inventory #: 21252
  • Brand: Nikon

    Description

    Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working
    Inventory # 21252
    Model No: Inspection Stage Chuck
    Removed from a Nikon NRM-3100 300mm Wafer Overlay Measurement System
    This Nikon 300mm Wafer Inspection Stage Chuck is used working surplus. The physical condition is good, but there are signs of previous use and handling.
    Sale Details
    Item Condition:
    Used Working, 90 Day Warranty
    Estimated Packed Shipping Dimensions:
    L x W x H = 24"x24"x24" @ 25 lbs.
    Shipping Terms:
    All Domestic and International shipping quotes and/or fees are subject to change due to packaging requirements, custom packing, transport rate fluctuations, and supply chain demands. We will contact you regarding any shipments that require or incur additional after purchase packing fees or rate changes.
    Only items pictured are included:
    If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
    For items with multiple quantities:
    The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
    Items are sold with a
    90-Day Satisfaction Guarantee
    Lister 31